Reflection loss and bandwidth performance of X-band infinite reflectarrays: simulations and measurements

Abbasi, Muhammad Inam and Ismail, Muhammad Yusof (2010) Reflection loss and bandwidth performance of X-band infinite reflectarrays: simulations and measurements. Microwave and Optical Technology Letters, 53 (1). pp. 77-80.

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Abstract

A technique for the measurement of scattering parameters of an infinite reflectarray is presented which takes into account effects of mutual coupling. Infinite reflectarrays designed at 10 GHz with different substrate thicknesses have been analyzed in which maximum 10% and 20% bandwidth values from resonance are shown to be 157 MHZ and 250 MHz, respectively, constructed on 0.508-mm thick substrate.Moreover, a figure of merit (FOM) has been defined which decreases from 0.320 to 0.26/MHz as the substrate thickness is increased from 0.127 to 0.508 mm, and the results demonstrate a significant decrease in the slope of reflection phase curve.

Item Type:Article
Uncontrolled Keywords:infinite reflectarray; waveguide simulator; reflection loss; bandwidth; figure of merit
Subjects:T Technology > TK Electrical engineering. Electronics Nuclear engineering > TK6573-6595 Radar
Divisions:Faculty of Electrical and Electronic Engineering > Department of Communication Engineering
ID Code:2994
Deposited By:Normajihan Abd. Rahman
Deposited On:07 Feb 2013 21:38
Last Modified:22 Jan 2015 11:42

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