Morsin, Marriatyi and Isaak, Suhaila and Morsin, Marlia and Yusof, Yusmeeraz (2017) Characterization of defect induced multilayer graphene. International Journal of Electrical and Computer Engineering (IJECE), 7 (3). pp. 1452-1458. ISSN 2088-8708
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Abstract
A study of oxygen plasma on multilayer graphene is done with different flow rates. This is to allow a controlled amount of defect fabricated on the graphene. Results from the study showed that the intensity ratio of defect between D peak and G peak was strongly depended on the amount of oxygen flow rate thus affected the 2D band of the spectra. The inter-defect distance LD ≥ 15 nm of each sample indicated that low-defect density was fabricated. The surface roughness of the multilayer graphene also increased and reduced the conductivity of the multilayer graphene.
Item Type: | Article |
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Uncontrolled Keywords: | Multilayer graphene; Oxygen plasma; Raman spectroscopy; Reactive ion etching |
Subjects: | T Technology > TA Engineering (General). Civil engineering (General) > TA401-492 Materials of engineering and construction. Mechanics of materials |
Divisions: | Faculty of Electrical and Electronic Engineering > Department of Electronic Enngineering |
Depositing User: | Mrs. Siti Noraida Miskan |
Date Deposited: | 07 Dec 2021 08:00 |
Last Modified: | 07 Dec 2021 08:00 |
URI: | http://eprints.uthm.edu.my/id/eprint/4584 |
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