Improvement inaccuracy correlation IC radiated electric fields measurement in GTEM cell to SAC using a correction factor

Chua, King Lee and Mohd Jenu, Mohd Zarar and Man, On Wong and Ying, See Hour (2014) Improvement inaccuracy correlation IC radiated electric fields measurement in GTEM cell to SAC using a correction factor. In: International Integrated Engineering Summit (IIES 2014), 1-4 December 2014, Universiti Tun Hussein Onn Malaysia, Johor.

[img]
Preview
PDF
586Kb

Abstract

GTEM cell appears to be a popular test facility for integrated circuits (ICs) radiated emission evaluations in the past. Since the GTEM cell is a single port test device, the GTEM measurement cannot specifically differentiate components between electric and magnetic fields. Both fields are captured as a global quantity in GTEM measurement. It therefore is a suspicion that the radiated emission measurements using GTEM cell is less precise in contrast to scanning technique i.e. near field probe scan. However, GTEM cell is a cost effective test device that provides good ambient shielding to conduct field measurement in broad frequency. The GTEM measurement usually is associated to semi-anechoic chamber (SAC) measurement. Thus, this study attempts to improve the correlation of the GTEM to SAC using a correction factor. In particular, a specific pattern was developed to replicate wide-ranging IC interconnections for the evaluations in GTEM cell and SAC. The horizontal and vertical electric fields based on the GTEM measurements were preprocessed using Matlab code before it is ready to attain the correction factor. Finally, the correction factor is employed to adjust the deviation while correlating the IC radiated electric fields of GTEM cell to semi-anechoic chamber. The results indicate a great improvement after regulating the GTEM fields with the correction factor. This implies the GTEM cell measurement is possible to achieve a good accuracy using a correction factor

Item Type:Conference or Workshop Item (Paper)
Uncontrolled Keywords:GTEM cell; radiated emission; integrated circuit; SAC
Subjects:T Technology > TK Electrical engineering. Electronics Nuclear engineering > TK7800-8360 Electronics
Divisions:Faculty of Electrical and Electronic Engineering > Department of Computer Engineering
ID Code:6532
Deposited By:Mrs. Nurhayati Ali
Deposited On:15 Jun 2015 16:40
Last Modified:15 Jun 2015 16:40

Repository Staff Only: item control page