Improvement on SPOC+ test program with ambient test removal

Mohd Effendi, Hana Nabila (2016) Improvement on SPOC+ test program with ambient test removal. Masters thesis, Universiti Tun Hussein Onn Malaysia.

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Abstract

Semiconductor is one of the elements that can conduct electricity with certain conditions by making it a good medium to control the electric current. Automotive applications are one of the higher demands in semiconductor industries because in automotive technologies, revolutions have been driven into two motivations which are maximizing comfort and applying zero defects method. The market demands of automotive chips are increasing with the higher demand of new vehicle. As semiconductor industries, the improvement in accomplish the customer request is our main vision with zero defects and low cost. These project objectives are to improve test yield, to implement ambient test removal, to save cost in production line and to reduce the test time. During the studies, all the root cause of high failure reject is analyse by finding the root cause. The analysis of the root cause is finding by using Root Cause Analysis and performs distribution from data extraction using CEDA analysis software. The comparison yield from each temperature had been made. The analysis finding that the low yield is because of the test program is not optimized in Revision 2.04. The test program revision 2.05 had been updated with the new limit by using six sigma calculations. From the test program update, the monitoring is continued to check the stability of the test program to continue with the ambient test removal. Ambient test removal analysis had been performed with 3x77pcs data collection to calculate the new limit parameter at cold and warm. With the new limit setting, 10k data verification is continue to check whether cold and warm test can segregate all the rejects. In this case, the test results at ambient test must be 100% pass. This entire works gives a result where test yield improve from 97% to 99%, remove ambient test, save cost from buying extra handler which cost € 954,723 and test time reduction from 11 days to 7days.

Item Type:Thesis (Masters)
Subjects:T Technology > TK Electrical engineering. Electronics Nuclear engineering > TK7800-8360 Electronics
ID Code:8813
Deposited By:Mr. Mohammad Shaifulrip Ithnin
Deposited On:06 Feb 2017 15:02
Last Modified:06 Feb 2017 15:02

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