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ICXRI'14: surface characterization of multilayer native oxide on metal-alloy interface: angle resolved XPS (AR-XPS) study

Embong, Zaidi (2014) ICXRI'14: surface characterization of multilayer native oxide on metal-alloy interface: angle resolved XPS (AR-XPS) study. [Video]

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Abstract

By Assoc. Prof. Dr. Zaidi Embong, UTHM; at the International Conference On X-Rays & Related Technique in Research & Industry 2014

Item Type: Video
Additional Information: Software requirements: 1. Internet Explorer (IE) 2. Microsoft Silverlight
Subjects: T Technology > TA Engineering (General). Civil engineering (General) > TA401-492 Materials of engineering and construction. Mechanics of materials
Depositing User: Mr. Mohammad Shaifulrip Ithnin
Date Deposited: 12 Dec 2018 08:47
Last Modified: 12 Dec 2018 08:47
URI: http://eprints.uthm.edu.my/id/eprint/10854
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