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Optical and microwave materials characterization using waveguide techniques

Kok, Yeow You and Esa, Fahmiruddin (2018) Optical and microwave materials characterization using waveguide techniques. In: Optical Fiber Laser Technology. Penerbit UTHM, pp. 53-76. ISBN 978-967-2216-63-6


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In general, the optical devices are predominantly used to guide waves. The complex refractive index, n (= n′ - jn″) of the used material in the optical devices has played an important role in determining the guide wave efficiency and design guide of the devices. On the other hand, the rapid development of microwave synthetic materials causes the study of material characterization to become increasingly important today, such as graphene, metamaterials, and carbon nanotube. The interaction between material and microwave can be described by the relative complex permittivity, εr (= εr′ - jεr″). For macroscopic material characteristic investigations, relative permittivity εr, relative complex permeability μr (=μr′ - jμr″) and conductivity σ are normally determined. However, many microwave measurements only focus on the properties of εr rather than the μr and the σ due to μr and σ have only the effect of changing at very low frequency. Besides, within the past 40 years, there were some materials used for Terahertz applications in which the operating frequency of 300 GHz to 3 THz occupies a middle ground between microwaves and infrared light waves. In fact, both optical and microwave material characterization use the equivalent principle and the relationship between n and εr is given as n2 = εr. Differentiations between microwave and optical (infrared) methods are the application of operating frequency (Microwave: 300 MHz to 300 GHz; Infrared: 300 GHz to 430 THz) and excited source (in Fig. 6.1).

Item Type: Book Section
Subjects: T Technology > T Technology (General)
Depositing User: Mr Abdul Rahim Mat Radzuan
Date Deposited: 31 Oct 2019 02:41
Last Modified: 31 Oct 2019 02:41
URI: http://eprints.uthm.edu.my/id/eprint/11849
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