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Scattering parameter measurements of infinite reflectarray using waveguide simulator

Ismail, Muhammad Yusof and Inam, M. (2010) Scattering parameter measurements of infinite reflectarray using waveguide simulator. In: Malaysian Technical Universities Conference on Engineering and Technology (MUCET 2010) , 28-29 June 2010 , Melaka, Malaysia .

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Infinite reflectarrays with different substrate thicknesses of Rogers 5880 have been designed in the X-band frequency range and the scattering parameter measurements have been carried out using waveguide simulator. The measured measured results are found out to in close agreement with the simulations with the simulations carried out using commercially available computer models of CST of substrate thickness on the reflection loss and reflectarray have been explained in details. It has also been demonstrated that the measured reflection has loss decreases from 15 dB to 0.72 dB as the thickness of the substrate is increased from 0.127mm to 0.787mm which shows the effect of dielectric absorption on the reflectarrays loss performance. Furthermore it has been observed that the slope of the reflection phase curve decreases as the substrate thickness is increased showing a sharp increased showing a sharp increase in bandwidth performance. However this improvement in reflection loss and bandwidth performance results in the phase range errors which are measured from the phase range of reflection phase curve. The phase range decreases from 355' to 280' as the thickness from 0.127mm to 0.787mm.

Item Type: Conference or Workshop Item (Paper)
Uncontrolled Keywords: reflectarray; substrate thickness; scattering parameter measurements; reflection loss; phase range
Subjects: T Technology > TK Electrical engineering. Electronics Nuclear engineering > TK7800-8360 Electronics
Divisions: Faculty of Electrical and Electronic Engineering > Department of Communication Engineering
Depositing User: Normajihan Abd. Rahman
Date Deposited: 22 Jan 2013 12:59
Last Modified: 21 Jan 2015 07:44
URI: http://eprints.uthm.edu.my/id/eprint/2996
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