UTHM Institutional Repository

The effect of nickel doping on SAC305 lead-free solders and EN(B)EPIG surface finish

Osman, Saliza Azlina and A., Ourdjini and Mohd Ariff, Azmah Hanim (2014) The effect of nickel doping on SAC305 lead-free solders and EN(B)EPIG surface finish. In: 36th International Electronics Manufacturing Technology Conference (IEMT 2014), 11-13 November 2014, Johor Bahru, Johor.


Download (499kB)


Recently, there are many portable electronics product such as i-pad, smart phone and tablet were widely used due to growing needs of busy lives and demandin& more functionalities and compatibility. The growing of these smart technologies made electronic packaging are moving parallel with current technology and expanding rapidly because of global competitive pressure. Thus, flip chip technology is one of the important element need to be considered in order to produce high performance and quality of electronic devices due to shorter electrical connections between the chip and substrate and very high input/output capacity and the smallest possible package size. In flip chip applications, solder bump was used to connect the die to the substrate or circuit board. The addition of doping element in lead-free solder has been discussed have a big influence on the solder joint quality including solder microstructure. It also can enhanced the properties and improve the performance of interfacial reaction at interface and made a reliability of lead-free solder especially on Sn-3.0Ag-0.5Cu was increased. Therefore, this study investigates the effect of nickel doping on Sn-3.0Ag-0.5Cu (SAC305) lead-free solders and electroless nickel (boron)/electroless palladium/immersion gold (EN(B)EPIG) surface finish. In this study, two types of lead-free solders was used which are Sn-3.0Ag-0.5Cu (SAC305) and Sn-3.0Ag-0.5Cu-0.05Ni (SACN30505) with solder size diameter of 500 pm in order to examine the effect ofnickel on interfacial reaction during soldering process. Reliability of solder joint has been assessed by performing solid state isothermal aging at 125"C for 250, 500, 1000 and 2000 hours. Several charccterization techniques will be conducted including image analyzer, optical microscope, field emission scanning electron microscopy and enerry dispersive x-ray analysis to characterize the intermetallic formed. After reflow soldering process, it was found that the (Cu,Ni)6Sn5 and (Ni,Cu)3Sna intermetallic compound (IMC) is formed at interface. (Ni,Cu):Snq dominates in the outside of solder joint while (Cu,Ni)6Sn5 dominates in the centre of joints.Besides that, after soldering and isothermal aging process, SAC305 solder with additions of 0.05%o of Ni (SACN30505) made the intermetallics grew slightly faster than in the solder without Ni additions. Hence, analysis by optical microscope revealed that the IMC thickness of the SACN30505 solder produced thicker IMC compared to SAC305 for both situations. This observation is confirmed by the increase in grain size of intermetallics with Ni additions. Moreover, aging time resulted in an increase in thickness and changed the morphology into more spherical, dense and large grain size. In addition. the results also revealed that the thickness of intermetallics formed is proportional to the aging duration.

Item Type: Conference or Workshop Item (Paper)
Subjects: T Technology > TS Manufactures > TS155-194 Production management. Operations management
Divisions: Faculty of Mechanical and Manufacturing Engineering > Department of Manufacturing and Industrial Engineering
Depositing User: Normajihan Abd. Rahman
Date Deposited: 30 Mar 2015 07:46
Last Modified: 30 Mar 2015 07:46
URI: http://eprints.uthm.edu.my/id/eprint/6501
Statistic Details: View Download Statistic

Actions (login required)

View Item View Item


Downloads per month over past year