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Design and calibration of a compact quasi-optical system for material characterization in millimeter/submillimeter wave domain

Alireza, Kazemipour and Hudlička, Martin and Yee, See Khee and Salhi, Mohammed A. and Allal, Djamel and Kleine-Ostmann, Thomas and Schrader, Thorsten (2015) Design and calibration of a compact quasi-optical system for material characterization in millimeter/submillimeter wave domain. IEEE Transactions on Instrumentation and Measurement, 64 (6). pp. 1438-1445. ISSN 0018-9456

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Abstract

A compact quasi-optical setup based on conventional rectangular horn antennas and two symmetrical parabolic mirrors is designed to provide a plane wave on the material under test. To measure the scattering parameters at millimeter/submillimeter wavelengths, a commercial vector network analyzer and waveguide frequency extension units are used. The calibration of the system is performed with a simple practical deembedding process to determine the S-parameters on the material surface without using high-cost micrometer positioners. A reliable extraction method is presented to derive the material permittivity and calculate the errors and uncertainties as direct functions of the sample and setup geometry and their physical characteristics. Several materials are measured and the complex permittivity is presented together with a detailed uncertainty budget.

Item Type: Article
Uncontrolled Keywords: free-space calibration; material characterization; material {characterization}; millimeter and submillimeter waves; permittivity; quasi-optical setup; uncertainty budget; uncertainty budget
Subjects: T Technology > T Technology (General)
Divisions: Faculty of Electrical and Electronic Engineering > Department of Communication Engineering
Depositing User: Normajihan Abd. Rahman
Date Deposited: 13 Aug 2018 03:39
Last Modified: 13 Aug 2018 03:39
URI: http://eprints.uthm.edu.my/id/eprint/8142
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