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ICXRI '14: surface characterization of multilayer native oxide on metal-alloy interface: angle resolved XPS (AR-XPS) study

Embong, Zaidi (2014) ICXRI '14: surface characterization of multilayer native oxide on metal-alloy interface: angle resolved XPS (AR-XPS) study. [Video]

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Abstract

By: Assoc. Prof. Dr. Zaidi Embong (UTHM)

Item Type: Video
Additional Information: Software requirements: 1. Internet Explorer (IE) 2. Microsoft Silverlight
Subjects: T Technology > TS Manufactures > TS200-770 Metal manufactures. Metalworking
Divisions: Faculty of Applied Science and Technology > Department of Science
Depositing User: Mr. Mohammad Shaifulrip Ithnin
Date Deposited: 10 Jan 2018 04:36
Last Modified: 10 Jan 2018 04:36
URI: http://eprints.uthm.edu.my/id/eprint/8623
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