Items where Author is "Kamsin, Norfauzi"

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Conference or Workshop Item

Abdullah, Farisal and Nayan, Nafarizal and Abdul Jamil , Muhammad Mahadi and Kamsin, Norfauzi IDD scan test method for fault localization technique on CMOS VLSI failure analysis. In: International Conference on Software Engineering (ISCE2010), 28-30 June 2010, Melaka, Malaysia .

This list was generated on Mon Jun 25 14:21:50 2018 MYT.