Items where Author is "Kamsin, Norfauzi"

Up a level
Export as [feed] RSS 2.0 [feed] RSS 1.0 [feed] Atom
Group by: Item Type | No Grouping
Number of items: 1.

Conference or Workshop Item

Abdullah, Farisal and Nayan, Nafarizal and Abdul Jamil , Muhammad Mahadi and Kamsin, Norfauzi IDD scan test method for fault localization technique on CMOS VLSI failure analysis. In: International Conference on Software Engineering (ISCE2010), 28-30 June 2010, Melaka, Malaysia .

This list was generated on Sat Nov 25 06:17:48 2017 MYT.