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Items where Subject is "T Technology > TK Electrical engineering. Electronics Nuclear engineering > TK455 Catalogs of electric machinery and supplies"

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Hassan, Hasliza (2018) The failure of integrated circuit: test and analysis. In: Current advances in microdevices and nano technology. Penerbit UTHM, pp. 173-182. ISBN 978-967-2306-25-2

This list was generated on Tue Nov 12 23:55:31 2019 +08.