UTHM Institutional Repository

Items where Subject is "T Technology > TK Electrical engineering. Electronics Nuclear engineering > TK455 Catalogs of electric machinery and supplies"

Up a level
Export as [feed] Atom [feed] RSS 1.0 [feed] RSS 2.0
Group by: Creators | Item Type
Jump to: H
Number of items at this level: 1.


Hassan, Hasliza (2018) The failure of integrated circuit: test and analysis. In: Current advances in microdevices and nano technology. Penerbit UTHM, pp. 173-182. ISBN 978-967-2306-25-2

This list was generated on Fri Nov 27 20:35:45 2020 +08.