Items where Author is "Abdullah, Farisal"

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Conference or Workshop Item

Abdullah, Farisal and Nayan, Nafarizal and Abdul Jamil , Muhammad Mahadi (2011) Failure analysis using IDD current leakage and photo localization for gate oxide defect of CMOS VLSI. In: Student Conference on Research and Development (SCOReD 2010), 13-14 December 2010, Putrajaya, Malaysia.

Abdullah, Farisal and Nayan, Nafarizal and Abdul Jamil , Muhammad Mahadi and Kamsin, Norfauzi IDD scan test method for fault localization technique on CMOS VLSI failure analysis. In: International Conference on Software Engineering (ISCE2010), 28-30 June 2010, Melaka, Malaysia .

This list was generated on Thu Sep 21 11:14:38 2017 MYT.